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Deep learning based correction and data modeling techniques as tools for chemometricians
1 : Thomas Bocklitz
(Leibniz-IPHT and IPC/ACP)
Albert-Einstein-Straße 9, 07745 Jena, Germany Friedrich-Schiller-University, Helmholtzweg 4, D-07743 Jena, Germany -
Allemagne
| Type : | : | oral |
| Thématiques | : | Keynote Speaker |
| Mots-Clés | : | Deep learning ; correction methods ; data modeling |
| PDF version | : |  PDF version |
